Energy dispersive X-ray fluorescence spectroscopy (EDXRF) is a routinely used analytical technique for the qualitative and quantitative determination of the elemental composition of a large number of sample types. The main reason for the large variety of applications and frequency of use of X-ray fluorescence analysis (XRF) is that this analytical method enables fast and non-destructive multi-element analyses - from sodium Na to uranium U - to be performed. And this in a measuring range from a few ppm to high weight percentages.

The brand new NEX CG II EDXRF spectrometer delivers excellent results in a wide matrix range - from homogeneous, low viscosity liquids to solids, metals, powders, pastes and slurried samples coatings and thin films - with minimal sample preparation.
It is especially suitable for the semi-quantitative determination of element fractions in completely unknown samples. The X-ray fluorescence spectrometer is widely used in environmental analysis (determination of heavy metals), food analysis, research and industry.

System features:

• Completely newly designed instrument with improved analytical performances:

• Indirect excitation for exceptionally low detection limits

• The only true Cartesian Geometry EDXRF on the market with X-ray paths at 90° angles (orthogonal) which is more efficient and creates polarization, putting all the X-rays all in one plane
• 50 kV 50 W (NEX CG II) or 65 kV 100 W (NEX CG II+) Pd anode X-ray tube
• 5 secondary targets and polarizers combined with a newly optimized Al target for a 10 times lower LOD for some elements.
• Indirect Excitation suppresses the Bremsstrahlung Background across the entire energy range and increases the Signal-to-noise to deliver lower detection limits and improved precision and thus excellent FP performances

• Most advanced large-area silicon drift detector (SDD)

• high-throughput SDD with <135eV @ Mn K-alpha line
• Digital pulse processor with user selectable shaping time
• Delivers an increase sensitivity of at least a factor 2 for most elements compared to the first NEX CG generation, making the NEX CG II even comparable to some WDXRF for some applications.

• Improved helium purge requiring only half of the flowrate (0.35 L/min) compared to the NEX CG

• Newly developed sample changers with unique park position to avoid any risk of spillage after measurement available in 4 versions:

• 15 positions 32mm
• 10 positions 40mm
• 10 positions 40mm with sample spinning
• 9 positions 52mm for large samples like filters

• Large Sample Chamber
  • 32.5 cm diameter x 7.5 cm deep

• Reduced physical size by 40% and reduced weight by 18% compared to the first generation NEX CG

• Powerful and easy to use QuantEZ software
  • Multilingual User Interface
  • LIMS

• Low cost of ownership backed by a 2-year warranty