Energy dispersive X-ray fluorescence (EDXRF) is a technique routinely used for the qualitative and quantitative determination of main and trace elements in a variety of different sample types. The high versatility results from the ability to perform fast and non-destructive multi-element analyses from low parts-per-million (ppm) concentrations to high weight percent (wt%) concentrations for the elements sodium (11Na) to uranium (92U).

Our versatile NEX DE VS EDXRF spectrometer delivers excellent results in a wide matrix range - from homogeneous, low viscosity liquids to solids, thin films, metals, powders, pasty and slurried samples - with minimal or no sample preparation.

Using silicon drift detector technology, the instrument provides both significantly improved resolutions and counting statistics, resulting in superior calibration accuracy and precision for even the most complex measurements.

The NEX DE VS is the optimal solution for demanding applications, or in situations where analysis time or sample throughput is critical, and features outstanding high sensitivity for heavy elements such as cadmium or lead.

With the NEX DE VS's integrated high-resolution camera, a specific zone (1, 3 or 10 mm collimator spot size possible) of the sample or a mm sample can be easily analyzed.