Energy dispersive X-ray fluorescence (EDXRF) is a technique routinely used for the qualitative and quantitative determination of main and trace elements in a variety of different sample types. The high versatility results from the ability to perform fast and non-destructive multi-element analyses from low parts-per-million (ppm) concentrations to high weight percent (wt%) concentrations for the elements sodium (₁₁Na) to uranium (₉₂U).

The versatile NEX DE EDXRF spectrometer provides routine elemental analysis of a wide range of basic substances - from homogeneous liquids of any viscosity to solids, thin films, alloys, suspensions, powders and pastes.

Using silicon drift detector technology, the instrument provides both significantly improved resolutions and counting statistics, resulting in superior calibration accuracy and precision even for the most complex measurements.

The NEX DE is the optimal solution for demanding applications, or where analysis time or sample throughput is critical, and features outstanding high sensitivity for heavy elements such as cadmium or lead.