Innovation Creates Greater Efficiency
The newly designed innovative ion source, UEIS (Ultra Efficiency Ion Source), effectively prevents ion source contamination, thus, there are more ionized molecules transferred to the detector to give superior sensitivity and the detector lifetime gets extended.The individually connected double filaments and structural modification of ion source make the maintenance cost less expensive and more efficient.
More Than Sensitivity
▪ UEIS (Ultra Efficiency Ion Source) with each enhanced part such as lens and pre-filters to maximize efficiency of ionization for superior sensitivity▪ EM (Electron Multiplier): Six spiral multiplier channels to increase linear output current for excellent sensitivity (SNR 2,500:1, IDL < 10 fg)
More Than Performance
▪ Wide mass range: 1 ~ 1,200 amu▪ Rapid scan speed: Up to 20,000 amu/s
More Than Reliability
▪ High capacity of turbo pump: 240L/s of standard vacuum system for fast stabilization▪ Double filaments: Uninterruptible and stable analysis to minimize instrument downtime
▪ Ultra-inert ion source, pre-filter and quadrupole to reduce contaminations
More Than Variety
▪ EI as standard and CI (PCI & NCI) as option▪ Scan, SIM, Simultaneous Scan/SIM mode
▪ Various library support depending on application
High Performance of ChroZen GC/MS
ChroZen GC/MS offers very low instrument detection limit (IDL) less than 10 fg in the SIM mode by 100 fg OFN injected. A deflecting electrode eliminates neutral particles reaching the detection system, so it allows you to improve the sensitivity for the trace level analysis and enhance signal to noise ratio.
ChroZen GC/MS ensures signal to noise ratio higher than 2,500:1 by 1 pg injection of OFN in scan mode.
Sample Preparation/Introduction
Direct Inlet Probe (DIP)
With DIP option, you can utilize the MS as stand-alone by injecting liquid or solid samples directlyinto the MS. Switching from GC/MS injection to DIP/MS injection takes only a couple of minutes.
Please don't hesitate to contact us if you are interested in the device and/or further technical information.